Cover image for Logic testing and design for testability
Title:
Logic testing and design for testability
Author:
Fujiwara, Hideo.
ISBN:
9780262256186
Publication Information:
Cambridge, Mass. : MIT Press, c1985.
Physical Description:
1 online resource (x, 284 p.) : ill.
Series:
MIT Press series in computer systems
Series Title:
MIT Press series in computer systems
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