Title:
Multi-run Memory Tests for Pattern Sensitive Faults
Author:
Mrozek, Ireneusz. author.
ISBN:
9783319912042
Edition:
1st ed. 2019.
Physical Description:
X, 135 p. 34 illus. online resource.
Added Corporate Author:
Electronic Access:
https://doi.org/10.1007/978-3-319-91204-2Copies:
Available:*
Library | Material Type | Item Barcode | Shelf Number | Status | Item Holds |
|---|---|---|---|---|---|
Searching... | E-Book | 487779-1001 | ONLINE | Searching... | Searching... |