Cover image for Lifetime Spectroscopy A Method of Defect Characterization in Silicon for Photovoltaic Applications
Title:
Lifetime Spectroscopy A Method of Defect Characterization in Silicon for Photovoltaic Applications
Author:
Rein, Stefan. author.
ISBN:
9783540279228
Physical Description:
XXVI, 489 p. 153 illus. online resource.
Series:
Springer Series in Material Science, 85
Series Title:
Springer Series in Material Science, 0933-033X ; 85
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E-Book 181606-2001 ONLINE
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