Cover image for Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition
Title:
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition
Author:
Sachdev, Manoj. editor.
ISBN:
9780387465470
Physical Description:
XXI, 328 p. online resource.
Series:
Frontiers in Electronic Testing, 34
Series Title:
Frontiers in Electronic Testing, 0929-1296 ; 34
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E-Book 166351-2001 ONLINE
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