Title:
Contactless VLSI Measurement and Testing Techniques
Author:
Sayil, Selahattin. author.
ISBN:
9783319696737
Edition:
1st ed. 2018.
Physical Description:
V, 93 p. 34 illus., 11 illus. in color. online resource.
Added Corporate Author:
Electronic Access:
https://doi.org/10.1007/978-3-319-69673-7Copies:
Available:*
Library | Material Type | Item Barcode | Shelf Number | Status | Item Holds |
|---|---|---|---|---|---|
Searching... | E-Book | 401142-1001 | ONLINE | Searching... | Searching... |