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1. 
Cover image for Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002
Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002
Author 
Vilarinho, Paula Maria. editor. Rosenwaks, Yossi. editor. Kingon, Angus. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-4020-3019-3
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2. 
Cover image for Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices
Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices
Author 
Sikula, Josef. editor. Levinshtein, Michael. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/1-4020-2170-4
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3. 
Cover image for Applied Physics of Carbon Nanotubes Fundamentals of Theory, Optics and Transport Devices
Applied Physics of Carbon Nanotubes Fundamentals of Theory, Optics and Transport Devices
Author 
Rotkin, Slava V. editor. Subramoney, Shekhar. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/3-540-28075-8
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4. 
Cover image for Materials Fundamentals of Gate Dielectrics
Materials Fundamentals of Gate Dielectrics
Author 
Demkov, Alexander A. editor. Navrotsky, Alexandra. editor. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/1-4020-3078-9
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