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1. 
Cover image for Introduction to Focused Ion Beams Instrumentation, Theory, Techniques and Practice
Introduction to Focused Ion Beams Instrumentation, Theory, Techniques and Practice
Author 
Giannuzzi, Lucille A. editor. Stevie, Fred A. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b101190
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2. 
Cover image for Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002
Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002
Author 
Vilarinho, Paula Maria. editor. Rosenwaks, Yossi. editor. Kingon, Angus. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/1-4020-3019-3
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3. 
Cover image for Springer Handbook of Condensed Matter and Materials Data
Springer Handbook of Condensed Matter and Materials Data
Author 
Martienssen, Werner. editor. Warlimont, Hans. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/3-540-30437-1
Format: 
Availability 
Online Library~1
Available:
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