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1. 
Cover image for Design and Analysis of Biomolecular Circuits Engineering Approaches to Systems and Synthetic Biology
Design and Analysis of Biomolecular Circuits Engineering Approaches to Systems and Synthetic Biology
Author 
Koeppl, Heinz. editor. Setti, Gianluca. editor. di Bernardo, Mario. editor. Densmore, Douglas. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-6766-4
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2. 
Cover image for Formal Development of a Network-Centric RTOS Software Engineering for Reliable Embedded Systems
Formal Development of a Network-Centric RTOS Software Engineering for Reliable Embedded Systems
Author 
Verhulst, Eric. author. Boute, Raymond T. author. Faria, José Miguel Sampaio. author. Sputh, Bernhard H.C. author. Mezhuyev, Vitaliy. author.
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http://dx.doi.org/10.1007/978-1-4419-9736-4
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3. 
Cover image for Millimeter-Wave Low Noise Amplifiers
Millimeter-Wave Low Noise Amplifiers
Author 
Božanić, Mladen. author. Sinha, Saurabh. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-69020-9
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4. 
Cover image for Integrated Optical Interconnect Architectures for Embedded Systems
Integrated Optical Interconnect Architectures for Embedded Systems
Author 
O'Connor, Ian. editor. Nicolescu, Gabriela. editor. SpringerLink (Online service)
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ONLINE(330817.1)
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http://dx.doi.org/10.1007/978-1-4419-6193-8
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5. 
Cover image for Automotive Radar Sensors in Silicon Technologies
Automotive Radar Sensors in Silicon Technologies
Author 
Jain, Vipul. author. Heydari, Payam. author. SpringerLink (Online service)
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ONLINE(330821.1)
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http://dx.doi.org/10.1007/978-1-4419-6775-6
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6. 
Cover image for Bio/CMOS Interfaces and Co-Design
Bio/CMOS Interfaces and Co-Design
Author 
Carrara, Sandro. author. SpringerLink (Online service)
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ONLINE(331564.1)
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http://dx.doi.org/10.1007/978-1-4614-4690-3
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7. 
Cover image for Adaptable Embedded Systems
Adaptable Embedded Systems
Author 
Beck, Antonio Carlos Schneider. editor. Lang Lisbôa, Carlos Arthur. editor. Carro, Luigi. editor. SpringerLink (Online service)
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ONLINE(331281.1)
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http://dx.doi.org/10.1007/978-1-4614-1746-0
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8. 
Cover image for Nanometer Variation-Tolerant SRAM Circuits and Statistical Design for Yield
Nanometer Variation-Tolerant SRAM Circuits and Statistical Design for Yield
Author 
Abu-Rahma, Mohamed H. author. Anis, Mohab. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4614-1749-1
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9. 
Cover image for 3D TCAD Simulation for Semiconductor Processes, Devices and Optoelectronics
3D TCAD Simulation for Semiconductor Processes, Devices and Optoelectronics
Author 
Li, Simon. author. Fu, Yue. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4614-0481-1
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10. 
Cover image for SystemVerilog for Verification A Guide to Learning the Testbench Language Features
SystemVerilog for Verification A Guide to Learning the Testbench Language Features
Author 
Spear, Chris. author. Tumbush, Greg. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4614-0715-7
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11. 
Cover image for Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
Author 
Shen, Ruijing. author. Tan, Sheldon X.-D. author. Yu, Hao. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4614-0788-1
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12. 
Cover image for Reliability, Availability and Serviceability of Networks-on-Chip
Reliability, Availability and Serviceability of Networks-on-Chip
Author 
Cota, Érika. author. Morais Amory, Alexandre. author. Soares Lubaszewski, Marcelo. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4614-0791-1
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