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1. 
Cover image for Leakage in Nanometer CMOS Technologies
Leakage in Nanometer CMOS Technologies
Author 
Narendra, Siva G. author. Chandrakasan, Anantha. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-28133-9
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2. 
Cover image for BioMEMS
BioMEMS
Author 
Urban, Gerald A. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-28732-4
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3. 
Cover image for Low-Power Low-Voltage Sigma-Delta Modulators in Nanometer CMOS
Low-Power Low-Voltage Sigma-Delta Modulators in Nanometer CMOS
Author 
Yao, Libin. author. Steyaert, Michiel. author. Sansen, Willy. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-4020-4140-3
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4. 
Cover image for PRECISION TEMPERATURE SENSORS IN CMOS TECHNOLOGY
PRECISION TEMPERATURE SENSORS IN CMOS TECHNOLOGY
Author 
Pertijs, Michiel A.P. author. Huijsing, Johan H. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-4020-5258-8
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5. 
Cover image for Essential Issues in SOC Design Designing Complex Systems-on-Chip
Essential Issues in SOC Design Designing Complex Systems-on-Chip
Author 
Lin, Youn-Long Steve. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-4020-5352-5
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6. 
Cover image for AmIware Hardware Technology Drivers of Ambient Intelligence
AmIware Hardware Technology Drivers of Ambient Intelligence
Author 
Mukherjee, Satyen. editor. Aarts, Ronald M. editor. Roovers, Raf. editor. Widdershoven, Frans. editor. Ouwerkerk, Martin. editor.
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http://dx.doi.org/10.1007/1-4020-4198-5
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7. 
Cover image for Radio Design in Nanometer Technologies
Radio Design in Nanometer Technologies
Author 
ISMAIL, MOHAMMED. editor. GONZÁLEZ, DELIA RODRÍGUEZ DE LLERA. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-4824-1
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8. 
Cover image for Fully-Depleted SOI CMOS Circuits and Technology for Ultralow-Power Applications
Fully-Depleted SOI CMOS Circuits and Technology for Ultralow-Power Applications
Author 
Sakurai, Takayasu. author. Matsuzawa, Akira. author. Douseki, Takakuni. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-29218-2
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