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1. 
Cover image for MEMS Linear and Nonlinear Statics and Dynamics
MEMS Linear and Nonlinear Statics and Dynamics
Author 
Younis, Mohammad I. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-6020-7
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2. 
Cover image for Predictive Technology Model for Robust Nanoelectronic Design
Predictive Technology Model for Robust Nanoelectronic Design
Author 
Cao, Yu. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-0445-3
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3. 
Cover image for Electrical Conductive Adhesives with Nanotechnologies
Electrical Conductive Adhesives with Nanotechnologies
Author 
Li, Yi. author. Lu, Daniel. author. Wong, C. P. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-88783-8
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4. 
Cover image for Embedded Memories for Nano-Scale VLSIs
Embedded Memories for Nano-Scale VLSIs
Author 
Zhang, Kevin. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-88497-4
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5. 
Cover image for Copper Interconnect Technology
Copper Interconnect Technology
Author 
Gupta, Tapan. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-0076-0
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6. 
Cover image for More than Moore Creating High Value Micro/Nanoelectronics Systems
More than Moore Creating High Value Micro/Nanoelectronics Systems
Author 
Zhang, Guo Qi. editor. Roosmalen, Alfred. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-75593-9
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7. 
Cover image for Radio Frequency Integrated Circuits and Technologies
Radio Frequency Integrated Circuits and Technologies
Author 
Ellinger, Frank. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-69325-3
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8. 
Cover image for Nanotechnology-Enabled Sensors
Nanotechnology-Enabled Sensors
Author 
Kalantar-zadeh, Kourosh. author. Fry, Benjamin. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-68023-1
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9. 
Cover image for Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Author 
Tehranipoor, Mohammad. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-74747-7
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10. 
Cover image for Nanometer Technology Designs High-Quality Delay Tests
Nanometer Technology Designs High-Quality Delay Tests
Author 
Tehranipoor, Mohammad. author. Ahmed, Nisar. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-75728-5
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11. 
Cover image for Design for Manufacturability and Yield for Nano-Scale CMOS
Design for Manufacturability and Yield for Nano-Scale CMOS
Author 
Chiang, Charles C. author. Kawa, Jamil. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-5188-3
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12. 
Cover image for Ultra-Low Voltage Nano-Scale Memories
Ultra-Low Voltage Nano-Scale Memories
Author 
Itoh, Kiyoo. editor. Horiguchi, Masashi. editor. Tanaka, Hitoshi. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-68853-4
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