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1. 
Cover image for New Directions in Thin Film Nanophotonics
New Directions in Thin Film Nanophotonics
Author 
K. V., Sreekanth. author. ElKabbash, Mohamed. author. Caligiuri, Vincenzo. author. Singh, Ranjan. author. De Luca, Antonio. author.
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https://doi.org/10.1007/978-981-13-8891-0
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2. 
Cover image for Advanced Packaging and Manufacturing Technology Based on Adhesion Engineering Wafer-Level Transfer Packaging and Fabrication Techniques Using Interface Energy Control Method
Advanced Packaging and Manufacturing Technology Based on Adhesion Engineering Wafer-Level Transfer Packaging and Fabrication Techniques Using Interface Energy Control Method
Author 
Seok, Seonho. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-77872-3
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3. 
Cover image for Nanomaterials Imaging Techniques, Surface Studies, and Applications Selected Proceedings of the FP7 International Summer School Nanotechnology: From Fundamental Research to Innovations, August 26-September 2, 2012, Bukovel, Ukraine
Nanomaterials Imaging Techniques, Surface Studies, and Applications Selected Proceedings of the FP7 International Summer School Nanotechnology: From Fundamental Research to Innovations, August 26-September 2, 2012, Bukovel, Ukraine
Author 
Fesenko, Olena. editor. Yatsenko, Leonid. editor. Brodin, Mikhaylo. editor. SpringerLink (Online service)
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ONLINE(332321.1)
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http://dx.doi.org/10.1007/978-1-4614-7675-7
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4. 
Cover image for Helium Ion Microscopy Principles and Applications
Helium Ion Microscopy Principles and Applications
Author 
Joy, David C. author. SpringerLink (Online service)
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ONLINE(332438.1)
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http://dx.doi.org/10.1007/978-1-4614-8660-2
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5. 
Cover image for Local Electrode Atom Probe Tomography A User's Guide
Local Electrode Atom Probe Tomography A User's Guide
Author 
Larson, David J. author. Prosa, Ty J. author. Ulfig, Robert M. author. Geiser, Brian P. author. Kelly, Thomas F. author.
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ONLINE(332444.1)
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http://dx.doi.org/10.1007/978-1-4614-8721-0
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6. 
Cover image for Optical Absorption of Impurities and Defects in Semiconducting Crystals Electronic Absorption of Deep Centres and Vibrational Spectra
Optical Absorption of Impurities and Defects in Semiconducting Crystals Electronic Absorption of Deep Centres and Vibrational Spectra
Author 
Pajot, Bernard. author. Clerjaud, Bernard. author. SpringerLink (Online service)
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ONLINE(333081.1)
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http://dx.doi.org/10.1007/978-3-642-18018-7
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7. 
Cover image for Ellipsometry at the Nanoscale
Ellipsometry at the Nanoscale
Author 
Losurdo, Maria. editor. Hingerl, Kurt. editor. SpringerLink (Online service)
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ONLINE(333782.1)
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http://dx.doi.org/10.1007/978-3-642-33956-1
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8. 
Cover image for Acoustic Scanning Probe Microscopy
Acoustic Scanning Probe Microscopy
Author 
Marinello, Francesco. editor. Passeri, Daniele. editor. Savio, Enrico. editor. SpringerLink (Online service)
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ONLINE(333153.1)
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http://dx.doi.org/10.1007/978-3-642-27494-7
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9. 
Cover image for In Situ Transmission Electron Microscopy Studies of Carbon Nanotube Nucleation Mechanism and Carbon Nanotube-Clamped Metal Atomic Chains
In Situ Transmission Electron Microscopy Studies of Carbon Nanotube Nucleation Mechanism and Carbon Nanotube-Clamped Metal Atomic Chains
Author 
Tang, Dai-Ming. author. SpringerLink (Online service)
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ONLINE(334395.1)
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http://dx.doi.org/10.1007/978-3-642-37259-9
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10. 
Cover image for Ceramic Materials Science and Engineering
Ceramic Materials Science and Engineering
Author 
Carter, C. Barry. author. Norton, M. Grant. author. SpringerLink (Online service)
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ONLINE(331349.1)
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http://dx.doi.org/10.1007/978-1-4614-3523-5
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11. 
Cover image for Electrohydrodynamic Patterning of Functional Materials
Electrohydrodynamic Patterning of Functional Materials
Author 
Oppenheimer, Pola Goldberg. author. SpringerLink (Online service)
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ONLINE(332800.1)
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http://dx.doi.org/10.1007/978-3-319-00783-0
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12. 
Cover image for Scanning Probe Microscopy in Nanoscience and Nanotechnology 3
Scanning Probe Microscopy in Nanoscience and Nanotechnology 3
Author 
Bhushan, Bharat. editor. SpringerLink (Online service)
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ONLINE(333137.1)
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http://dx.doi.org/10.1007/978-3-642-25414-7
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