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1. 
Cover image for Systemverilog for Verification A Guide to Learning the Testbench Language Features
Systemverilog for Verification A Guide to Learning the Testbench Language Features
Author 
Spear, Chris. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b138536
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2. 
Cover image for SystemVerilog for Design A Guide to Using SystemVerilog for Hardware Design and Modeling
SystemVerilog for Design A Guide to Using SystemVerilog for Hardware Design and Modeling
Author 
Sutherland, Stuart. author. Davidmann, Simon. author. Flake, Peter. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/0-387-36495-1
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3. 
Cover image for Interconnect Noise Optimization in Nanometer Technologies
Interconnect Noise Optimization in Nanometer Technologies
Author 
Elgamel, Mohamed A. author. Bayoumi, Magdy A. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/0-387-29366-3
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4. 
Cover image for Scalable Hardware Verification with Symbolic Simulation
Scalable Hardware Verification with Symbolic Simulation
Author 
Bertacco, Valeria. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/0-387-29906-8
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5. 
Cover image for Leakage in Nanometer CMOS Technologies
Leakage in Nanometer CMOS Technologies
Author 
Narendra, Siva G. author. Chandrakasan, Anantha. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/0-387-28133-9
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6. 
Cover image for Knowledge Enterprise: Intelligent Strategies in Product Design, Manufacturing, and Management Proceedings of PROLAMAT 2006, IFIP TC5 International Conference, June 15–17, 2006, Shanghai, China
Knowledge Enterprise: Intelligent Strategies in Product Design, Manufacturing, and Management Proceedings of PROLAMAT 2006, IFIP TC5 International Conference, June 15–17, 2006, Shanghai, China
Author 
Wang, Kesheng. editor. Kovacs, George L. editor. Wozny, Michael. editor. Fang, Minglun. editor. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/0-387-34403-9
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