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1. 
Cover image for Novel Algorithms for Fast Statistical Analysis of Scaled Circuits
Novel Algorithms for Fast Statistical Analysis of Scaled Circuits
Author 
Singhee, Amith. author. Rutenbar, Rob A. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-90-481-3100-6
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2. 
Cover image for Languages for Embedded Systems and their Applications Selected Contributions on Specification, Design, and Verification from FDL’08
Languages for Embedded Systems and their Applications Selected Contributions on Specification, Design, and Verification from FDL’08
Author 
Radetzki, Martin. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-9714-0
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3. 
Cover image for Zuverlässigkeit mechatronischer Systeme Grundlagen und Bewertung in frühen Entwicklungsphasen
Zuverlässigkeit mechatronischer Systeme Grundlagen und Bewertung in frühen Entwicklungsphasen
Author 
Bertsche, Bernd. author. Göhner, Peter. author. Jensen, Uwe. author. Schinköthe, Wolfgang. author. Wunderlich, Hans-Joachim. author.
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-85091-5
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4. 
Cover image for Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation 18th International Workshop, PATMOS 2008, Lisbon, Portugal, September 10-12, 2008. Revised Selected Papers
Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation 18th International Workshop, PATMOS 2008, Lisbon, Portugal, September 10-12, 2008. Revised Selected Papers
Author 
Svensson, Lars. editor. Monteiro, José. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-95948-9
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