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1. 
Cover image for Extreme Statistics in Nanoscale Memory Design
Extreme Statistics in Nanoscale Memory Design
Author 
Singhee, Amith. editor. Rutenbar, Rob A. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-6606-3
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2. 
Cover image for Reliability Physics and Engineering Time-To-Failure Modeling
Reliability Physics and Engineering Time-To-Failure Modeling
Author 
McPherson, J. W. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(332682.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-319-00122-7
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3. 
Cover image for Electronic Noise and Interfering Signals Principles and Applications
Electronic Noise and Interfering Signals Principles and Applications
Author 
Vasilescu, Gabriel. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b137720
Format: 
Availability 
Online Library~1
Available:
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