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1. 
Cover image for Reliability Physics and Engineering Time-To-Failure Modeling
Reliability Physics and Engineering Time-To-Failure Modeling
Author 
McPherson, J. W. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-93683-3
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2. 
Cover image for The Electrical Contact of the Pantograph-Catenary System Theory and Application
The Electrical Contact of the Pantograph-Catenary System Theory and Application
Author 
Wu, Guangning. author. Gao, Guoqiang. author. Wei, Wenfu. author. Yang, Zefeng. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-13-6589-8
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3. 
Cover image for VLSI Design and Test for Systems Dependability
VLSI Design and Test for Systems Dependability
Author 
Asai, Shojiro. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-4-431-56594-9
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4. 
Cover image for Design for Manufacturability From 1D to 4D for 90–22 nm Technology Nodes
Design for Manufacturability From 1D to 4D for 90–22 nm Technology Nodes
Author 
Balasinski, Artur. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-1-4614-1761-3
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5. 
Cover image for Bias Temperature Instability for Devices and Circuits
Bias Temperature Instability for Devices and Circuits
Author 
Grasser, Tibor. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-1-4614-7909-3
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