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2013
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1. 
Cover image for Ellipsometry at the Nanoscale
Ellipsometry at the Nanoscale
Author 
Losurdo, Maria. editor. Hingerl, Kurt. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333782.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-33956-1
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2. 
Cover image for Nondestructive Testing of Materials and Structures
Nondestructive Testing of Materials and Structures
Author 
Büyüköztürk, Oral. author. Taşdemir, Mehmet Ali. author. Güneş, Oğuz. editor. Akkaya, Yılmaz. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(335698.1)
Electronic Access 
http://dx.doi.org/10.1007/978-94-007-0723-8
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Availability 
Online Library~1
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