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1. 
Cover image for Semiconductor Power Devices Physics, Characteristics, Reliability
Semiconductor Power Devices Physics, Characteristics, Reliability
Author 
Lutz, Josef. author. Schlangenotto, Heinrich. author. Scheuermann, Uwe. author. De Doncker, Rik. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-70917-8
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2. 
Cover image for In-Service Fatigue Reliability of Structures
In-Service Fatigue Reliability of Structures
Author 
Petinov, Sergei V. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-89318-1
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3. 
Cover image for Reliability Aspect of Cloud Computing Environment
Reliability Aspect of Cloud Computing Environment
Author 
Kumar, Vikas. author. Vidhyalakshmi, R. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-13-3023-0
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4. 
Cover image for Safety-Critical Electrical Drives Topologies, Reliability, Performance
Safety-Critical Electrical Drives Topologies, Reliability, Performance
Author 
Bolvashenkov, Igor. author. Herzog, Hans-Georg. author. Frenkel, Ilia. author. Khvatskin, Lev. author. Lisnianski, Anatoly. author.
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https://doi.org/10.1007/978-3-319-89969-5
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5. 
Cover image for Human Factors and Reliability Engineering for Safety and Security in Critical Infrastructures Decision Making, Theory, and Practice
Human Factors and Reliability Engineering for Safety and Security in Critical Infrastructures Decision Making, Theory, and Practice
Author 
De Felice, Fabio. editor. Petrillo, Antonella. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-62319-1
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6. 
Cover image for Point Processes for Reliability Analysis Shocks and Repairable Systems
Point Processes for Reliability Analysis Shocks and Repairable Systems
Author 
Cha, Ji Hwan. author. Finkelstein, Maxim. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-73540-5
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7. 
Cover image for Recent Advances in Multi-state Systems Reliability Theory and Applications
Recent Advances in Multi-state Systems Reliability Theory and Applications
Author 
Lisnianski, Anatoly. editor. Frenkel, Ilia. editor. Karagrigoriou, Alex. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-63423-4
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8. 
Cover image for The theory and applications of reliability with emphasis on Bayesian and nonparametric methods
The theory and applications of reliability with emphasis on Bayesian and nonparametric methods
Author 
Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida) Tsokos, Chris P. Shimi, I. N. United States. Air Force. Office of Scientific Research. University of South Florida.
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ScienceDirect http://www.sciencedirect.com/science/book/9780127021010
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9. 
Cover image for Computer Safety, Reliability, and Security SAFECOMP 2018 Workshops, ASSURE, DECSoS, SASSUR, STRIVE, and WAISE, Västerås, Sweden, September 18, 2018, Proceedings
Computer Safety, Reliability, and Security SAFECOMP 2018 Workshops, ASSURE, DECSoS, SASSUR, STRIVE, and WAISE, Västerås, Sweden, September 18, 2018, Proceedings
Author 
Gallina, Barbara. editor. (orcid)0000-0002-6952-1053 Skavhaug, Amund. editor. Schoitsch, Erwin. editor. (orcid)0000-0002-0335-5443 Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121 SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-99229-7
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10. 
Cover image for Crossbar-Based Interconnection Networks Blocking, Scalability, and Reliability
Crossbar-Based Interconnection Networks Blocking, Scalability, and Reliability
Author 
Jahanshahi, Mohsen. author. Bistouni, Fathollah. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-78473-1
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11. 
Cover image for High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip
High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip
Author 
Wang, Zheng. author. Chattopadhyay, Anupam. author. (orcid)0000-0002-8818-6983 SpringerLink (Online service)
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https://doi.org/10.1007/978-981-10-1073-6
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12. 
Cover image for Advances in Human Error, Reliability, Resilience, and Performance Proceedings of the AHFE 2017 International Conference on Human Error, Reliability, Resilience, and Performance, July 17–21,2017, The Westin Bonaventure Hotel,Los Angeles, California, USA
Advances in Human Error, Reliability, Resilience, and Performance Proceedings of the AHFE 2017 International Conference on Human Error, Reliability, Resilience, and Performance, July 17–21,2017, The Westin Bonaventure Hotel,Los Angeles, California, USA
Author 
Boring, Ronald Laurids. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-60645-3
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