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1. 
Cover image for Nanometer Technology Designs High-Quality Delay Tests
Nanometer Technology Designs High-Quality Delay Tests
Author 
Tehranipoor, Mohammad. author. Ahmed, Nisar. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-75728-5
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2. 
Cover image for China's High-Speed Rail Technology An International Perspective
China's High-Speed Rail Technology An International Perspective
Author 
Fang, Youtong. editor. Zhang, Yuehong (Helen). editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-10-5610-9
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Online Library~1
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