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2023
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1. 
Cover image for Interconnect Reliability in Advanced Memory Device Packaging
Interconnect Reliability in Advanced Memory Device Packaging
Author 
Gan, Chong Leong,. author. Huang, Chen-Yu,. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-26708-6
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2. 
Cover image for Which-Is-Better (WIB): Problems in Reliability Theory
Which-Is-Better (WIB): Problems in Reliability Theory
Author 
Mizutani, Satoshi. author. Zhao, Xufeng. author. Nakagawa, Toshio. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-27316-2
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3. 
Cover image for Applications in Reliability and Statistical Computing
Applications in Reliability and Statistical Computing
Author 
Pham, Hoang. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-21232-1
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4. 
Cover image for Optimal Inspection Models with Their Applications
Optimal Inspection Models with Their Applications
Author 
Ito, Kodo. author. Nakagawa, Toshio. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-22021-0
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5. 
Cover image for Risk-Conscious Operations Management An Integrated Paradigm for Complex Engineering System
Risk-Conscious Operations Management An Integrated Paradigm for Complex Engineering System
Author 
Varde, Prabhakar V. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-19-9334-3
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