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1. 
Cover image for Strong and Weak Topology Probed by Surface Science Topological Insulator Properties of Phase Change Alloys and Heavy Metal Graphene
Strong and Weak Topology Probed by Surface Science Topological Insulator Properties of Phase Change Alloys and Heavy Metal Graphene
Author 
Pauly, Christian. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-658-11811-2
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2. 
Cover image for Laser Additive Manufacturing of High-Performance Materials
Laser Additive Manufacturing of High-Performance Materials
Author 
Gu, Dongdong. author. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-3-662-46089-4
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3. 
Cover image for Temperature Measurement during Millisecond Annealing Ripple Pyrometry for Flash Lamp Annealers
Temperature Measurement during Millisecond Annealing Ripple Pyrometry for Flash Lamp Annealers
Author 
Reichel, Denise. author. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-3-658-11388-9
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4. 
Cover image for Acoustic, Electromagnetic, Neutron Emissions from Fracture and Earthquakes
Acoustic, Electromagnetic, Neutron Emissions from Fracture and Earthquakes
Author 
Carpinteri, Alberto. editor. Lacidogna, Giuseppe. editor. Manuello, Amedeo. editor. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-3-319-16955-2
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5. 
Cover image for From Single Molecules to Nanoscopically Structured Materials
From Single Molecules to Nanoscopically Structured Materials
Author 
Basché, Thomas. editor. Müllen, Klaus. editor. Schmidt, Manfred. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-05828-3
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6. 
Cover image for In-situ Structure Characterization of Elastomers during Deformation and Fracture
In-situ Structure Characterization of Elastomers during Deformation and Fracture
Author 
Brüning, Karsten. author. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-3-319-06907-4
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7. 
Cover image for Surface Microscopy with Low Energy Electrons
Surface Microscopy with Low Energy Electrons
Author 
Bauer, Ernst. author. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-1-4939-0935-3
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8. 
Cover image for In-situ Studies with Photons, Neutrons and Electrons Scattering II
In-situ Studies with Photons, Neutrons and Electrons Scattering II
Author 
Kannengiesser, Thomas. editor. Babu, Sudarsanam Suresh. editor. Komizo, Yu-ichi. editor. Ramirez, Antonio J. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-06145-0
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9. 
Cover image for Emerging Non-Volatile Memories
Emerging Non-Volatile Memories
Author 
Hong, Seungbum. editor. Auciello, Orlando. editor. Wouters, Dirk. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-1-4899-7537-9
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10. 
Cover image for Copper Electrodeposition for Nanofabrication of Electronics Devices
Copper Electrodeposition for Nanofabrication of Electronics Devices
Author 
Kondo, Kazuo. editor. Akolkar, Rohan N. editor. Barkey, Dale P. editor. Yokoi, Masayuki. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-1-4614-9176-7
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11. 
Cover image for Handbook of Porous Silicon
Handbook of Porous Silicon
Author 
Canham, Leigh. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-05744-6
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12. 
Cover image for Atom-Probe Tomography The Local Electrode Atom Probe
Atom-Probe Tomography The Local Electrode Atom Probe
Author 
Miller, Michael K. author. Forbes, Richard G. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-1-4899-7430-3
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