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1. 
Cover image for Computer, network, software, and hardware engineering with applications
Computer, network, software, and hardware engineering with applications
Author 
Schneidewind, Norman.
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ONLINE
Electronic Access 
IEEEXplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6168884
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2. 
Cover image for Service-learning in computer and information sciences practical applications in engineering education
Service-learning in computer and information sciences practical applications in engineering education
Author 
Nejmeh, Brian A. Wiley InterScience (Online service)
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IEEE Xplore http://ieeexplore.ieee.org/servlet/opac?bknumber=6218884
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3. 
Cover image for Communications engineering essentials for computer scientists and electrical engineers
Communications engineering essentials for computer scientists and electrical engineers
Author 
Lee, Richard Char-Tung, 1939- Chiu, Mao-Ching. Lin, Jung-Shan, 1964-
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5271091
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4. 
Cover image for IEEE Computer Society real-world software engineering problems a self-study guide for today's software professional
IEEE Computer Society real-world software engineering problems a self-study guide for today's software professional
Author 
Naveda, J. Fernando. Seidman, Stephen B.
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Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5989366
IEEE Xplore http://ieeexplore.ieee.org/servlet/opac?bknumber=5989366
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5. 
Cover image for Engineering electromagnetic compatibility principles, measurements, technologies, and computer models
Engineering electromagnetic compatibility principles, measurements, technologies, and computer models
Author 
Kodali, V. Prasad, 1939- IEEE Electromagnetic Compatibility Society.
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263941
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6. 
Cover image for Advanced instrumentation and computer I/O design real-time system computer interface engineering
Advanced instrumentation and computer I/O design real-time system computer interface engineering
Author 
Garrett, Patrick H.
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263677
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7. 
Cover image for Modeling for reliability analysis Markov modeling for reliability, maintainability, safety, and supportability analyses of complex computer systems
Modeling for reliability analysis Markov modeling for reliability, maintainability, safety, and supportability analyses of complex computer systems
Author 
Pukite, Jan, 1928- Pukite, Paul.
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263338
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8. 
Cover image for Software architecture. 1
Software architecture. 1
Author 
Oussalah, Mourad, editor of compilation.
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ONLINE(342044.1)
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John Wiley http://dx.doi.org/10.1002/9781118930960
Books24x7 http://www.books24x7.com/marc.asp?bookid=63727
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9. 
Cover image for Multi-agent machine learning : a reinforcement approach
Multi-agent machine learning : a reinforcement approach
Author 
Schwartz, Howard M., author.
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ONLINE(341941.1)
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Cover image http://catalogimages.wiley.com/images/db/jimages/9781118362082.jpg
Ebook Library http://public.eblib.com/choice/publicfullrecord.aspx?p=1775207
ebrary http://site.ebrary.com/id/10921255
John Wiley http://dx.doi.org/10.1002/9781118884614
MyiLibrary http://www.myilibrary.com?id=640727
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10. 
Cover image for Magnetic actuators and sensors
Magnetic actuators and sensors
Author 
Brauer, John R., 1943-
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ONLINE(341778.1)
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Ebook Library http://public.eblib.com/choice/publicfullrecord.aspx?p=1565913
John Wiley http://dx.doi.org/10.1002/9781118779262
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11. 
Cover image for Developments in data storage materials perspective
Developments in data storage materials perspective
Author 
Piramanayagam, S. N. Chong, Chong Tow. Wiley InterScience (Online service)
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6078481
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12. 
Cover image for Formal methods for industrial critical systems a survey of applications
Formal methods for industrial critical systems a survey of applications
Author 
Gnesi, Stefania, 1954- Margaria-Steffen, Tiziana, 1964-
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6381798
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