Limit Search Results
Author
Language
Publication Date
-
Subject
Material Type
Shelf Location
Library
Switch to list view
Switch to thumbnail view
Select an Action
4 Results Found Subscribe to search results
0000DEFAULT
Print
1. 
Cover image for Test Generation of Crosstalk Delay Faults in VLSI Circuits
Test Generation of Crosstalk Delay Faults in VLSI Circuits
Author 
Jayanthy, S. author. Bhuvaneswari, M.C. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-13-2493-2
Format: 
Availability 
Online Library~1
Available:
Copies:
2. 
Cover image for Multi-run Memory Tests for Pattern Sensitive Faults
Multi-run Memory Tests for Pattern Sensitive Faults
Author 
Mrozek, Ireneusz. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-91204-2
Format: 
Availability 
Online Library~1
Available:
Copies:
3. 
Cover image for Hybrid Fault Tolerance Techniques to Detect Transient Faults in Embedded Processors
Hybrid Fault Tolerance Techniques to Detect Transient Faults in Embedded Processors
Author 
Azambuja, José Rodrigo. author. Kastensmidt, Fernanda. author. Becker, Jürgen. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-06340-9
Format: 
Availability 
Online Library~1
Available:
Copies:
4. 
Cover image for Debug Automation from Pre-Silicon to Post-Silicon
Debug Automation from Pre-Silicon to Post-Silicon
Author 
Dehbashi, Mehdi. author. Fey, Görschwin. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-09309-3
Format: 
Availability 
Online Library~1
Available:
Copies: