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1. 
Cover image for Nanoscaled Semiconductor-on-Insulator Structures and Devices
Nanoscaled Semiconductor-on-Insulator Structures and Devices
Author 
Hall, Steve. editor. Nazarov, Alexei N. editor. Lysenko, Vladimir S. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-6380-0
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2. 
Cover image for Defects in High-k Gate Dielectric Stacks Nano-Electronic Semiconductor Devices
Defects in High-k Gate Dielectric Stacks Nano-Electronic Semiconductor Devices
Author 
Gusev, Evgeni. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/1-4020-4367-8
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3. 
Cover image for Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment Proceedings of the NATO Advanced Research Workshop on Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment Kiev, Ukraine 26–30 April 2004
Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment Proceedings of the NATO Advanced Research Workshop on Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment Kiev, Ukraine 26–30 April 2004
Author 
Flandre, Denis. editor. Nazarov, Alexei N. editor. Hemment, Peter L.F. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/1-4020-3013-4
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4. 
Cover image for Fundamentals of Electromigration-Aware Integrated Circuit Design
Fundamentals of Electromigration-Aware Integrated Circuit Design
Author 
Lienig, Jens. author. (orcid)0000-0002-2140-4587 Rothe, Susann. author. Thiele, Matthias. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-80023-8
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5. 
Cover image for Metal oxide semiconductors : synthesis, properties, and devices
Metal oxide semiconductors : synthesis, properties, and devices
Author 
Zang, Zhigang, author Cai, Wensi, author. Zhou, Yong, author.
Preferred Shelf Number 
TK7871.99 .M44
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9783527842551
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6. 
Cover image for Electrical connectors : design, manufacture, test, and selection
Electrical connectors : design, manufacture, test, and selection
Author 
Pecht, Michael, editor. Kyeong, San, editor.
Preferred Shelf Number 
TK3521
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119679837
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7. 
Cover image for Social-behavioral modeling for complex systems
Social-behavioral modeling for complex systems
Author 
Davis, Paul K., 1943- editor. O'Mahony, Angela, editor. Pfautz, Jonathan, editor.
Preferred Shelf Number 
HA29 .S6736 2019
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119485001
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8. 
Cover image for Modern electromagnetic scattering theory with applications
Modern electromagnetic scattering theory with applications
Author 
Osipov, Andrey (Andrey V.), author. Tretyakov, Sergei, author.
Preferred Shelf Number 
QC665 .S3 .O85 2017 EB
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119004639
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9. 
Cover image for A Second-Order ΣΔ ADC Using Sputtered IGZO TFTs
A Second-Order ΣΔ ADC Using Sputtered IGZO TFTs
Author 
Correia, Ana Paula Pinto. author. Cândido Barquinha, Pedro Miguel. author. Goes, João Carlos da Palma. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-27192-7
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