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1. 
Cover image for Multi-run Memory Tests for Pattern Sensitive Faults
Multi-run Memory Tests for Pattern Sensitive Faults
Author 
Mrozek, Ireneusz. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-91204-2
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2. 
Cover image for Hybrid Fault Tolerance Techniques to Detect Transient Faults in Embedded Processors
Hybrid Fault Tolerance Techniques to Detect Transient Faults in Embedded Processors
Author 
Azambuja, José Rodrigo. author. Kastensmidt, Fernanda. author. Becker, Jürgen. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-06340-9
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3. 
Cover image for Linear and nonlinear system modeling
Linear and nonlinear system modeling
Author 
Roy, Tamal, editor. Tripathi, Suman Lata, editor. Ganguli, Souvik, editor.
Preferred Shelf Number 
QA402.3 .L56 2024
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119847533
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4. 
Cover image for Resilient power electronic systems
Resilient power electronic systems
Author 
Kaboli, Shahriyar, 1975- author. Peyghami, Saeed, author. Blaabjerg, Frede, author.
Preferred Shelf Number 
TK7881.15 .K335 2022
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119772217
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5. 
Cover image for Real-time embedded systems
Real-time embedded systems
Author 
Wang, Jiacun, 1963- author.
Preferred Shelf Number 
TK7895 .E42
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119420712
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6. 
Cover image for Current Signature Analysis for Condition Monitoring of Cage Induction Motors : Industrial Application and Case Histories
Current Signature Analysis for Condition Monitoring of Cage Induction Motors : Industrial Application and Case Histories
Author 
Thomson, William T. Culbert, Ian.
Preferred Shelf Number 
TK2785
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119175476
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