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1. 
Cover image for Generalized Gaussian Error Calculus
Generalized Gaussian Error Calculus
Author 
Grabe, Michael. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-03305-6
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2. 
Cover image for Minimum Error Entropy Classification
Minimum Error Entropy Classification
Author 
Marques de Sá, Joaquim P. author. Silva, Luís M.A. author. Santos, Jorge M.F. author. Alexandre, Luís A. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333219.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-29029-9
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3. 
Cover image for Error Analysis with Applications in Engineering
Error Analysis with Applications in Engineering
Author 
Kotulski, Zbigniew A. author. Szczepinski, Wojciech. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-90-481-3570-7
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4. 
Cover image for Error Control for Network-on-Chip Links
Error Control for Network-on-Chip Links
Author 
Fu, Bo. author. Ampadu, Paul. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-9313-7
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5. 
Cover image for Error Correction Codes for Non-Volatile Memories
Error Correction Codes for Non-Volatile Memories
Author 
Micheloni, R. author. Marelli, A. author. Ravasio, R. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-8391-4
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6. 
Cover image for Human Reliability and Error in Transportation Systems
Human Reliability and Error in Transportation Systems
Author 
Dhillon, B. S. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-84628-812-8
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7. 
Cover image for Advances in Human Error, Reliability, Resilience, and Performance Proceedings of the AHFE 2017 International Conference on Human Error, Reliability, Resilience, and Performance, July 17–21,2017, The Westin Bonaventure Hotel,Los Angeles, California, USA
Advances in Human Error, Reliability, Resilience, and Performance Proceedings of the AHFE 2017 International Conference on Human Error, Reliability, Resilience, and Performance, July 17–21,2017, The Westin Bonaventure Hotel,Los Angeles, California, USA
Author 
Boring, Ronald Laurids. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-60645-3
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8. 
Cover image for Interfacial Compatibility in Microelectronics Moving Away from the Trial and Error Approach
Interfacial Compatibility in Microelectronics Moving Away from the Trial and Error Approach
Author 
Laurila, Tomi. author. Vuorinen, Vesa. author. Paulasto-Kröckel, Mervi. author. Turunen, Markus. author. Mattila, Toni T. author.
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4471-2470-2
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9. 
Cover image for Transient and Permanent Error Control for Networks-on-Chip
Transient and Permanent Error Control for Networks-on-Chip
Author 
Yu, Qiaoyan. author. Ampadu, Paul. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-0962-5
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10. 
Cover image for CMOS Cascade Sigma-Delta Modulators for Sensors and Telecom Error Analysis and Practical Design
CMOS Cascade Sigma-Delta Modulators for Sensors and Telecom Error Analysis and Practical Design
Author 
Río, R. del. author. Medeiro, F. author. Pérez-Verdú, B. author. Rosa, J. M. author. Rodríguez-V´zquez, Á. author.
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/1-4020-4776-2
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