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1. 
Cover image for Robust Filtering and Fault Detection of Switched Delay Systems
Robust Filtering and Fault Detection of Switched Delay Systems
Author 
Wang, Dong. author. Shi, Peng. author. Wang, Wei. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(334471.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-37685-6
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2. 
Cover image for From Multiscale Modeling to Meso-Science A Chemical Engineering Perspective
From Multiscale Modeling to Meso-Science A Chemical Engineering Perspective
Author 
Li, Jinghai. author. Ge, Wei. author. Wang, Wei. author. Yang, Ning. author. Liu, Xinhua. author.
Preferred Shelf Number 
ONLINE(333946.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-35189-1
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3. 
Cover image for Communications, Signal Processing, and Systems The 2012 Proceedings of the International Conference on Communications, Signal Processing, and Systems
Communications, Signal Processing, and Systems The 2012 Proceedings of the International Conference on Communications, Signal Processing, and Systems
Author 
Liang, Qilian. editor. Wang, Wei. editor. Mu, Jiasong. editor. Liang, Jing. editor. Zhang, Baoju. editor.
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-5803-6
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4. 
Cover image for Autonomous Flying Robots Unmanned Aerial Vehicles and Micro Aerial Vehicles
Autonomous Flying Robots Unmanned Aerial Vehicles and Micro Aerial Vehicles
Author 
Nonami, Kenzo. author. Kendoul, Farid. author. Suzuki, Satoshi. author. Wang, Wei. author. Nakazawa, Daisuke. author.
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-4-431-53856-1
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5. 
Cover image for Nano-Net 4th International ICST Conference, Nano-Net 2009, Lucerne, Switzerland, October 18-20, 2009. Proceedings
Nano-Net 4th International ICST Conference, Nano-Net 2009, Lucerne, Switzerland, October 18-20, 2009. Proceedings
Author 
Schmid, Alexandre. editor. Goel, Sanjay. editor. Wang, Wei. editor. Beiu, Valeriu. editor. Carrara, Sandro. editor.
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-04850-0
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