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Cover image for Advanced methods in materials processing defects
Advanced methods in materials processing defects
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Predeleanu, M. Gilormini, P. International Conference on Materials Processing Defects (3rd : 1997 : Cachan, France)
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ScienceDirect http://www.sciencedirect.com/science/book/9780444826701
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Cover image for Defect control in semiconductors proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989. Vol. 2
Defect control in semiconductors proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989. Vol. 2
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International Conference on the Science and Technology of Defect Control in Semiconductors (1989 : Yokohama-shi, Japan) Sumino, K. (Kōji), 1931-
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ScienceDirect http://www.sciencedirect.com/science/book/9780444884299
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