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1. 
Cover image for Optical Absorption of Impurities and Defects in Semiconducting Crystals Electronic Absorption of Deep Centres and Vibrational Spectra
Optical Absorption of Impurities and Defects in Semiconducting Crystals Electronic Absorption of Deep Centres and Vibrational Spectra
Author 
Pajot, Bernard. author. Clerjaud, Bernard. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333081.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-18018-7
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2. 
Cover image for Metal-to-Nonmetal Transitions
Metal-to-Nonmetal Transitions
Author 
Redmer, Ronald. editor. Hensel, Friedrich. editor. Holst, Bastian. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-03953-9
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3. 
Cover image for Light Scattering in Solid IX
Light Scattering in Solid IX
Author 
Cardona, Manuel. editor. Merlin, Roberto. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b14231
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4. 
Cover image for Materials Chemistry
Materials Chemistry
Author 
Fahlman, Bradley D. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-6120-2
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5. 
Cover image for Nanocrystals: Synthesis, Properties and Applications
Nanocrystals: Synthesis, Properties and Applications
Author 
Rao, C. N. R. author. Thomas, P. J. author. Kulkarni, G. U. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-68752-8
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6. 
Cover image for Handbook of Advanced Magnetic Materials
Handbook of Advanced Magnetic Materials
Author 
Liu, Yi. editor. Sellmyer, David J. editor. Shindo, Daisuke. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b115335
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7. 
Cover image for Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002
Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002
Author 
Vilarinho, Paula Maria. editor. Rosenwaks, Yossi. editor. Kingon, Angus. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/1-4020-3019-3
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