Lifetime Spectroscopy A Method of Defect Characterization in Silicon for Photovoltaic Applications

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Title:

Author:

Rein, Stefan. author.

ISBN:

9783540279228

Physical Description:

XXVI, 489 p. 153 illus. online resource.

Series:

Springer Series in Material Science, 85

Series Title:

Springer Series in Material Science, 0933-033X ; 85

Subject Term:

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Library	Material Type	Item Barcode	Shelf Number	Status	Item Holds
Searching... Online Library	E-Book	181606-2001	ONLINE	Searching... Unknown	Searching... Unavailable