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1. 
Cover image for Applied Pattern Recognition
Applied Pattern Recognition
Author 
Bunke, Horst. editor. Kandel, Abraham. editor. Last, Mark. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-76831-9
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Cover image for Similarity-Based Pattern Analysis and Recognition
Similarity-Based Pattern Analysis and Recognition
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Pelillo, Marcello. editor. SpringerLink (Online service)
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ONLINE(331228.1)
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http://dx.doi.org/10.1007/978-1-4471-5628-4
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Cover image for Computational Intelligence for Pattern Recognition
Computational Intelligence for Pattern Recognition
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Pedrycz, Witold. editor. Chen, Shyi-Ming. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-89629-8
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Cover image for Pattern Recognition and Classification An Introduction
Pattern Recognition and Classification An Introduction
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Dougherty, Geoff. author. SpringerLink (Online service)
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ONLINE(331742.1)
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http://dx.doi.org/10.1007/978-1-4614-5323-9
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5. 
Cover image for Pattern Recognition, Machine Intelligence and Biometrics
Pattern Recognition, Machine Intelligence and Biometrics
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Wang, Patrick S. P. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-642-22407-2
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6. 
Cover image for Data Complexity in Pattern Recognition
Data Complexity in Pattern Recognition
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Basu, Mitra. editor. Ho, Tin Kam. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-84628-172-3
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7. 
Cover image for Evolutionary Synthesis of Pattern Recognition Systems
Evolutionary Synthesis of Pattern Recognition Systems
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Bhanu, Bir. author. Lin, Yingqiang. author. Krawiec, Krzysztof. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b105515
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8. 
Cover image for Pattern Recognition : Concepts, Methods and Applications
Pattern Recognition : Concepts, Methods and Applications
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Marques de Sá, Joaquim P.
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TA1650 M37 2001
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9. 
Cover image for Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17–19, 2018, Proceedings
Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17–19, 2018, Proceedings
Author 
Bai, Xiao. editor. Hancock, Edwin R. editor. Ho, Tin Kam. editor. Wilson, Richard C. editor. Biggio, Battista. editor.
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https://doi.org/10.1007/978-3-319-97785-0
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10. 
Cover image for Pattern Recognition Applications and Methods 6th International Conference, ICPRAM 2017, Porto, Portugal, February 24–26, 2017, Revised Selected Papers
Pattern Recognition Applications and Methods 6th International Conference, ICPRAM 2017, Porto, Portugal, February 24–26, 2017, Revised Selected Papers
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De Marsico, Maria. editor. di Baja, Gabriella Sanniti. editor. Fred, Ana. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-93647-5
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11. 
Cover image for Pattern Recognition 10th Mexican Conference, MCPR 2018, Puebla, Mexico, June 27-30, 2018, Proceedings
Pattern Recognition 10th Mexican Conference, MCPR 2018, Puebla, Mexico, June 27-30, 2018, Proceedings
Author 
Martínez-Trinidad, José Francisco. editor. Carrasco-Ochoa, Jesús Ariel. editor. Olvera-López, José Arturo. editor. Sarkar, Sudeep. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-92198-3
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12. 
Cover image for Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications 22nd Iberoamerican Congress, CIARP 2017, Valparaíso, Chile, November 7–10, 2017, Proceedings
Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications 22nd Iberoamerican Congress, CIARP 2017, Valparaíso, Chile, November 7–10, 2017, Proceedings
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Mendoza, Marcelo. editor. (orcid)0000-0002-7969-6041 Velastín, Sergio. editor. (orcid)0000-0001-6775-7137 SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-75193-1
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