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1. 
Cover image for Theory of Defects in Semiconductors
Theory of Defects in Semiconductors
Author 
Drabold, David A. editor. Estreicher, Stefan K. editor. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/11690320
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2. 
Cover image for Physics and Properties of Narrow Gap Semiconductors
Physics and Properties of Narrow Gap Semiconductors
Author 
Chu, Junhao. author. Sher, Arden. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-74801-6
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3. 
Cover image for Oxide and Nitride Semiconductors Processing, Properties, and Applications
Oxide and Nitride Semiconductors Processing, Properties, and Applications
Author 
Yao, Takafumi. editor. Hong, Soon-Ku. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-88847-5
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4. 
Cover image for Narrow Gap Semiconductors 2007 Proceedings of the 13th International Conference, 8–12 July, 2007, Guildford, UK
Narrow Gap Semiconductors 2007 Proceedings of the 13th International Conference, 8–12 July, 2007, Guildford, UK
Author 
Murdin, Ben. editor. Clowes, Steve. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-8425-6
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5. 
Cover image for Nonequilibrium Carrier Dynamics in Semiconductors Proceedings of the 14th International Conference, July 25–29, 2005, Chicago, USA
Nonequilibrium Carrier Dynamics in Semiconductors Proceedings of the 14th International Conference, July 25–29, 2005, Chicago, USA
Author 
Saraniti, M. editor. Ravaioli, U. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-36588-4
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6. 
Cover image for Optical principles and technology for engineers
Optical principles and technology for engineers
Author 
Stewart, James E, author. Taylor and Francis.
Preferred Shelf Number 
TS165 .S749 2014
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7. 
Cover image for Slow light : science and applications
Slow light : science and applications
Author 
Khurgin, Jacob B. Tucker, Rodney S.
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QC389 .S64 2009
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