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1. 
Cover image for Mass Metrology
Mass Metrology
Author 
Gupta, S. V. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-23412-5
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2. 
Cover image for Metrology for Fire Experiments in Outdoor Conditions
Metrology for Fire Experiments in Outdoor Conditions
Author 
Silvani, Xavier. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(332373.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-7962-8
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3. 
Cover image for Graphene Nanoelectronics Metrology, Synthesis, Properties and Applications
Graphene Nanoelectronics Metrology, Synthesis, Properties and Applications
Author 
Raza, Hassan. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-22984-8
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4. 
Cover image for Modern characterization of electromagnetic systems and its associated metrology
Modern characterization of electromagnetic systems and its associated metrology
Author 
Sarkar, Tapan (Tapan K.), editor. Salazar-Palma, Magdalena, editor. Zhu, Ming Da, editor. Chen, Heng, 1990- editor.
Preferred Shelf Number 
QC760 .M53 2021
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119076230
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5. 
Cover image for The Physics of Metrology All about Instruments: From Trundle Wheels to Atomic Clocks
The Physics of Metrology All about Instruments: From Trundle Wheels to Atomic Clocks
Author 
Hebra, Alexius J. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-211-78381-8
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6. 
Cover image for Quantum information : from foundations to quantum technology applications
Quantum information : from foundations to quantum technology applications
Author 
Bruss, Dagmar, editor. Leuchs, Gerd, editor.
Preferred Shelf Number 
QA76.889
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9783527805785
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