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1. 
Cover image for Contactless VLSI Measurement and Testing Techniques
Contactless VLSI Measurement and Testing Techniques
Author 
Sayil, Selahattin. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-69673-7
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2. 
Cover image for Design and Testing of Digital Microfluidic Biochips
Design and Testing of Digital Microfluidic Biochips
Author 
Zhao, Yang. author. Chakrabarty, Krishnendu. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(331239.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-0370-8
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3. 
Cover image for Verification, validation, and testing of engineered systems
Verification, validation, and testing of engineered systems
Author 
Engel, Avner.
Preferred Shelf Number 
ONLINE
Electronic Access 
Books24x7 http://www.books24x7.com/marc.asp?bookid=35180
John Wiley http://dx.doi.org/10.1002/9780470618851
http://onlinelibrary.wiley.com/book/10.1002/9780470618851
http://proquest.safaribooksonline.com/?fpi=9781118029312
http://proquest.safaribooksonline.com/9781118029312
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4. 
Cover image for Models in Hardware Testing Lecture Notes of the Forum in Honor of Christian Landrault
Models in Hardware Testing Lecture Notes of the Forum in Honor of Christian Landrault
Author 
Wunderlich, Hans-Joachim. editor. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-90-481-3282-9
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5. 
Cover image for Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition
Author 
Sachdev, Manoj. editor. Gyvez, José Pineda de. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/0-387-46547-2
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6. 
Cover image for Accurate and Robust Spectral Testing with Relaxed Instrumentation Requirements
Accurate and Robust Spectral Testing with Relaxed Instrumentation Requirements
Author 
Zhuang, Yuming. author. Chen, Degang. author. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-3-319-77718-4
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7. 
Cover image for Power-Aware Testing and Test Strategies for Low Power Devices
Power-Aware Testing and Test Strategies for Low Power Devices
Author 
Girard, Patrick. editor. Nicolici, Nicola. editor. Wen, Xiaoqing. editor. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-0928-2
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8. 
Cover image for Timing Performance of Nanometer Digital Circuits Under Process Variations
Timing Performance of Nanometer Digital Circuits Under Process Variations
Author 
Champac, Victor. author. Garcia Gervacio, Jose. author. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-3-319-75465-9
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9. 
Cover image for Soft Errors in Modern Electronic Systems
Soft Errors in Modern Electronic Systems
Author 
Nicolaidis, Michael. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-6993-4
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10. 
Cover image for CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test
Author 
Pavlov, Andrei. author. Sachdev, Manoj. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-8363-1
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11. 
Cover image for New Methods of Concurrent Checking
New Methods of Concurrent Checking
Author 
Göessel, Michael. author. Ocheretny, Vitaly. author. Sogomonyan, Egor. author. Marienfeld, Daniel. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-8420-1
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12. 
Cover image for Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Author 
Tehranipoor, Mohammad. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-74747-7
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