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1. 
Cover image for Metrology
Metrology
Author 
Gao, Wei. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-10-4938-5
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2. 
Cover image for Advances in Thin Films, Nanostructured Materials, and Coatings Selected Papers from the 2018 International Conference on “Nanomaterials: Applications & Properties”
Advances in Thin Films, Nanostructured Materials, and Coatings Selected Papers from the 2018 International Conference on “Nanomaterials: Applications & Properties”
Author 
Pogrebnjak, Alexander D. editor. Novosad, Valentine. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-13-6133-3
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3. 
Cover image for New Directions in Thin Film Nanophotonics
New Directions in Thin Film Nanophotonics
Author 
K. V., Sreekanth. author. ElKabbash, Mohamed. author. Caligiuri, Vincenzo. author. Singh, Ranjan. author. De Luca, Antonio. author.
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Electronic Access 
https://doi.org/10.1007/978-981-13-8891-0
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4. 
Cover image for Heat transport in micro and nanoscale thin films
Heat transport in micro and nanoscale thin films
Author 
Yilbas, B. S. , author. Bin Mansoor, Saad, author. Ali, Haider , author.
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Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780323429795
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5. 
Cover image for RHEED Transmission Mode and Pole Figures Thin Film and Nanostructure Texture Analysis
RHEED Transmission Mode and Pole Figures Thin Film and Nanostructure Texture Analysis
Author 
Wang, Gwo-Ching. author. Lu, Toh-Ming. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-1-4614-9287-0
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