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1. 
Cover image for Codes, Cryptology and Information Security 4th International Conference, C2SI 2023, Rabat, Morocco, May 29-31, 2023, Proceedings
Codes, Cryptology and Information Security 4th International Conference, C2SI 2023, Rabat, Morocco, May 29-31, 2023, Proceedings
Author 
El Hajji, Said. editor. Mesnager, Sihem. editor. Souidi, El Mamoun. editor. SpringerLink (Online service)
Preferred Shelf Number 
XX(520866.1)
Electronic Access 
https://doi.org/10.1007/978-3-031-33017-9
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2. 
Cover image for A Graduate Introduction to Numerical Methods From the Viewpoint of Backward Error Analysis
A Graduate Introduction to Numerical Methods From the Viewpoint of Backward Error Analysis
Author 
Corless, Robert M. author. Fillion, Nicolas. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(332417.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-8453-0
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3. 
Cover image for A student's guide to data and error analysis
A student's guide to data and error analysis
Author 
Berendsen, Herman J. C.
Preferred Shelf Number 
ONLINE
Electronic Access 
EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=366295
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4. 
Cover image for Transportation systems reliability and safety
Transportation systems reliability and safety
Author 
Dhillon, B. S. (Balbir S.), 1947-
Preferred Shelf Number 
ONLINE
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
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5. 
Cover image for Measurements and their uncertainties a practical guide to modern error analysis
Measurements and their uncertainties a practical guide to modern error analysis
Author 
Hughes, Ifan, 1968- Hase, Thomas.
Preferred Shelf Number 
ONLINE
Electronic Access 
EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=330634
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6. 
Cover image for Measurement error models, methods, and applications
Measurement error models, methods, and applications
Author 
Buonaccorsi, John P.
Preferred Shelf Number 
ONLINE
Electronic Access 
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7. 
Cover image for Latent class analysis of survey error
Latent class analysis of survey error
Author 
Biemer, Paul P. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9780470891155
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8. 
Cover image for Dealing with uncertainties a guide to error analysis
Dealing with uncertainties a guide to error analysis
Author 
Drosg, Manfred.
Preferred Shelf Number 
ONLINE
Electronic Access 
EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=287984
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9. 
Cover image for Margins of error a study of reliability in survey measurement
Margins of error a study of reliability in survey measurement
Author 
Alwin, Duane F. (Duane Francis), 1944- Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
Contributor biographical information http://catdir.loc.gov/catdir/enhancements/fy0745/2006053191-b.html
John Wiley http://dx.doi.org/10.1002/9780470146316
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10. 
Cover image for Finite element analysis with error estimators an introduction to the FEM and adaptive error analysis for engineering students
Finite element analysis with error estimators an introduction to the FEM and adaptive error analysis for engineering students
Author 
Akin, J. E.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780750667227
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11. 
Cover image for Measurement error and misclassification in statistics and epidemiology impacts and Bayesian adjustments
Measurement error and misclassification in statistics and epidemiology impacts and Bayesian adjustments
Author 
Gustafson, Paul, 1968-
Preferred Shelf Number 
ONLINE
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12. 
Cover image for Optical bit error rate an estimation methodology
Optical bit error rate an estimation methodology
Author 
Kartalopoulos, Stamatios V.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263060
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