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1. 
Cover image for Applied reliability
Applied reliability
Author 
Tobias, Paul A. Trindade, David C.
Preferred Shelf Number 
TA169 T63 2012
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2. 
Cover image for Design for reliability
Design for reliability
Author 
Raheja, Dev. Gullo, Louis J.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791
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3. 
Cover image for Probabilistic reliability models
Probabilistic reliability models
Author 
Ushakov, I. A. (Igorʹ Alekseevich)
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ONLINE
Electronic Access 
Ebook Library Click here to view book
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Wiley InterScience http://dx.doi.org/10.1002/9781118370742
Books24x7 http://www.books24x7.com/marc.asp?bookid=49723
Volltext http://proquest.tech.safaribooksonline.de/9781118370766
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4. 
Cover image for Lead Free Solder Mechanics and Reliability
Lead Free Solder Mechanics and Reliability
Author 
Pang, John Hock Lye. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-0463-7
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5. 
Cover image for Semiconductor process reliability in practice
Semiconductor process reliability in practice
Author 
Gan, Zhenghao. Wong, Waisum. Liou, Juin J.
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ONLINE
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6. 
Cover image for Accelerated reliability and durability testing technology
Accelerated reliability and durability testing technology
Author 
Klyatis, Lev M.
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ONLINE
Electronic Access 
Wiley InterScience An electronic book accessible through the World Wide Web; click for information
ebrary http://site.ebrary.com/id/10592157
http://swb.eblib.com/patron/FullRecord.aspx?p=693204
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7. 
Cover image for Reliability and availability of cloud computing
Reliability and availability of cloud computing
Author 
Bauer, Eric. Adams, Randee. Wiley InterScience (Online service)
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ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266788
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8. 
Cover image for Reliability and maintenance networks and systems
Reliability and maintenance networks and systems
Author 
Beichelt, Frank, 1942- Tittmann, Peter.
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ONLINE
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9. 
Cover image for Semiconductor packaging materials interaction and reliability
Semiconductor packaging materials interaction and reliability
Author 
Chen, Andrea. Lo, Randy.
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10. 
Cover image for Advances in safety, reliability and risk management
Advances in safety, reliability and risk management
Author 
European Safety and Reliability Conference (2011 : Troyes, France) Berenguer, Christophe. Grall, Antoine. Soares, C. Guedes.
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ONLINE(342790.1)
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11. 
Cover image for Offshore Wind Turbines Reliability, availability and maintenance
Offshore Wind Turbines Reliability, availability and maintenance
Author 
Tavner, Peter
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ONLINE
Electronic Access 
http://dx.doi.org/10.1049/PBRN013E
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12. 
Cover image for Process plant equipment operation, control, and reliability
Process plant equipment operation, control, and reliability
Author 
Holloway, Michael D., 1963- Nwaoha, Chikezie, 1984- Onyewuenyi, Oliver A., 1952-
Preferred Shelf Number 
ONLINE
Electronic Access 
Wiley http://onlinelibrary.wiley.com/book/10.1002/9781118162569
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=822072
John Wiley http://dx.doi.org/10.1002/9781118162569
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