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1. 
Cover image for VLSI electronics microstructure science
VLSI electronics microstructure science
Author 
Einspruch, Norman G.
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Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780122341236
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2. 
Cover image for Learning from VLSI Design Experience
Learning from VLSI Design Experience
Author 
Lee, Weng Fook. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-030-03238-8
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3. 
Cover image for VLSI Design and Test for Systems Dependability
VLSI Design and Test for Systems Dependability
Author 
Asai, Shojiro. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-4-431-56594-9
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4. 
Cover image for Machine Learning in VLSI Computer-Aided Design
Machine Learning in VLSI Computer-Aided Design
Author 
Elfadel, Ibrahim (Abe) M. editor. Boning, Duane S. editor. Li, Xin. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-030-04666-8
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5. 
Cover image for Massive MIMO Detection Algorithm and VLSI Architecture
Massive MIMO Detection Algorithm and VLSI Architecture
Author 
Liu, Leibo. author. Peng, Guiqiang. author. Wei, Shaojun. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-13-6362-7
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6. 
Cover image for VLSI Design and Test 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers
VLSI Design and Test 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers
Author 
Sengupta, Anirban. editor. Dasgupta, Sudeb. editor. Singh, Virendra. editor. Sharma, Rohit. editor. Kumar Vishvakarma, Santosh. editor.
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-32-9767-8
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7. 
Cover image for VLSI-SoC: Design and Engineering of Electronics Systems Based on New Computing Paradigms 26th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2018, Verona, Italy, October 8–10, 2018, Revised and Extended Selected Papers
VLSI-SoC: Design and Engineering of Electronics Systems Based on New Computing Paradigms 26th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2018, Verona, Italy, October 8–10, 2018, Revised and Extended Selected Papers
Author 
Bombieri, Nicola. editor. Pravadelli, Graziano. editor. Fujita, Masahiro. editor. Austin, Todd. editor. Reis, Ricardo. editor.
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-030-23425-6
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8. 
Cover image for VLSI-SoC: Opportunities and Challenges Beyond the Internet of Things 25th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2017, Abu Dhabi, United Arab Emirates, October 23–25, 2017, Revised and Extended Selected Papers
VLSI-SoC: Opportunities and Challenges Beyond the Internet of Things 25th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2017, Abu Dhabi, United Arab Emirates, October 23–25, 2017, Revised and Extended Selected Papers
Author 
Maniatakos, Michail. editor. (orcid)0000-0001-6899-0651 Elfadel, Ibrahim (Abe) M. editor. (orcid)0000-0003-3220-9987 Sonza Reorda, Matteo. editor. (orcid)0000-0003-2899-7669 Ugurdag, H. Fatih. editor. (orcid)0000-0002-6256-0850 Monteiro, José. editor. (orcid)0000-0003-0603-2268
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https://doi.org/10.1007/978-3-030-15663-3
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9. 
Cover image for Test Generation of Crosstalk Delay Faults in VLSI Circuits
Test Generation of Crosstalk Delay Faults in VLSI Circuits
Author 
Jayanthy, S. author. Bhuvaneswari, M.C. author. SpringerLink (Online service)
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ONLINE
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https://doi.org/10.1007/978-981-13-2493-2
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10. 
Cover image for VLSI Design and Test 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers
VLSI Design and Test 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers
Author 
Rajaram, S. editor. Balamurugan, N.B. editor. Gracia Nirmala Rani, D. editor. Singh, Virendra. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
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https://doi.org/10.1007/978-981-13-5950-7
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