Switch to list view
Switch to thumbnail view
Select an Action
7 Results Found Subscribe to search results
0000000DEFAULT
Print
1. 
Cover image for Ultra-fast material metrology
Ultra-fast material metrology
Author 
Horn, Alexander, PD Dr.
Preferred Shelf Number 
ONLINE
Electronic Access 
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=482071
John Wiley http://dx.doi.org/10.1002/9783527627929
http://site.ebrary.com/lib/alltitles/Doc?id=10332978
Format: 
Availability 
Online Library~1
Available:
Copies:
2. 
Cover image for Optical imaging and metrology advanced technologies
Optical imaging and metrology advanced technologies
Author 
Osten, Wolfgang. Reingand, Nadya.
Preferred Shelf Number 
ONLINE
Electronic Access 
Connect to MyiLibrary resource.
http://public.eblib.com/EBLPublic/PublicView.do?ptiID=947916
Wiley http://dx.doi.org/10.1002/9783527648443
http://site.ebrary.com/lib/alltitles/Doc?id=10575536
Format: 
Availability 
Online Library~1
Available:
Copies:
3. 
Cover image for Software metrics and software metrology
Software metrics and software metrology
Author 
Abran, Alain, 1949-
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6381791
Format: 
Availability 
Online Library~1
Available:
Copies:
4. 
Cover image for Advances in speckle metrology and related techniques
Advances in speckle metrology and related techniques
Author 
Kaufmann, Guillermo H.
Preferred Shelf Number 
ONLINE
Electronic Access 
Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Wiley InterScience - Full Text Online http://onlinelibrary.wiley.com/book/10.1002/9783527633852
http://site.ebrary.com/lib/alltitles/Doc?id=10446636
Format: 
Availability 
Online Library~1
Available:
Copies:
5. 
Cover image for Transverse disciplines in metrology proceedings of the 13th International Metrology Congress, 2007, Lille, France
Transverse disciplines in metrology proceedings of the 13th International Metrology Congress, 2007, Lille, France
Author 
International Metrology Conference (13th : 2007 : French College of Metrology) Collège français de métrologie. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477706
John Wiley http://dx.doi.org/10.1002/9780470611371
http://site.ebrary.com/lib/alltitles/Doc?id=10360928
http://swb.eblib.com/patron/FullRecord.aspx?p=477706
HathiTrust Digital Library, Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/230183422.html
Format: 
Availability 
Online Library~1
Available:
Copies:
6. 
Cover image for Performance-based gear metrology kinematic-transmission-error computation and diagnosis
Performance-based gear metrology kinematic-transmission-error computation and diagnosis
Author 
Mark, William D.
Preferred Shelf Number 
ONLINE
Electronic Access 
Connect to MyiLibrary resource.
John Wiley http://dx.doi.org/10.1002/9781118357903
Books24x7 http://www.books24x7.com/marc.asp?bookid=51229
Format: 
Availability 
Online Library~1
Available:
Copies:
7. 
Cover image for A practical guide to optical metrology for thin films
A practical guide to optical metrology for thin films
Author 
Quinten, Michael.
Preferred Shelf Number 
ONLINE
Electronic Access 
Check for Full Text Access restricted: MSVU users only
Ebook Library Click here to view book
Connect to MyiLibrary resource.
John Wiley http://dx.doi.org/10.1002/9783527664344
Format: 
Availability 
Online Library~1
Available:
Copies: