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1. 
Cover image for Structural reliability
Structural reliability
Author 
Lemaire, Maurice. Wiley InterScience (Online service)
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ONLINE
Electronic Access 
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683
John Wiley http://dx.doi.org/10.1002/9780470611708
MyiLibrary, Table of contents http://www.myilibrary.com?id=216540&ref=toc
http://site.ebrary.com/lib/alltitles/Doc?id=10361215
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2. 
Cover image for Design for reliability
Design for reliability
Author 
Raheja, Dev. Gullo, Louis J.
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791
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3. 
Cover image for Practical system reliability
Practical system reliability
Author 
Bauer, Eric. Zhang, Xuemei. Kimber, Douglas A.
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ONLINE
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EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294
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4. 
Cover image for Probabilistic reliability models
Probabilistic reliability models
Author 
Ushakov, I. A. (Igorʹ Alekseevich)
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Ebook Library Click here to view book
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Wiley InterScience http://dx.doi.org/10.1002/9781118370742
Books24x7 http://www.books24x7.com/marc.asp?bookid=49723
Volltext http://proquest.tech.safaribooksonline.de/9781118370766
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5. 
Cover image for Accelerated reliability and durability testing technology
Accelerated reliability and durability testing technology
Author 
Klyatis, Lev M.
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ONLINE
Electronic Access 
Wiley InterScience An electronic book accessible through the World Wide Web; click for information
ebrary http://site.ebrary.com/id/10592157
http://swb.eblib.com/patron/FullRecord.aspx?p=693204
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6. 
Cover image for Reliability and availability of cloud computing
Reliability and availability of cloud computing
Author 
Bauer, Eric. Adams, Randee. Wiley InterScience (Online service)
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ONLINE
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266788
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7. 
Cover image for Multistate systems reliability theory with applications
Multistate systems reliability theory with applications
Author 
Natvig, Bent, 1946-
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John Wiley http://dx.doi.org/10.1002/9780470977088
http://site.ebrary.com/lib/alltitles/Doc?id=10469650
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8. 
Cover image for Reliability modeling, prediction, and optimization
Reliability modeling, prediction, and optimization
Author 
Blischke, W. R., 1934- Murthy, D. N. P. Wiley InterScience (Online service)
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ONLINE
Electronic Access 
Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Ebook Library Click here to view book
Available by subscription from Safari Books Online
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley043/99053029.html
HathiTrust Digital Library, Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/42708105.html
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9. 
Cover image for Semiconductor memories technology, testing, and reliability
Semiconductor memories technology, testing, and reliability
Author 
Sharma, Ashok K. IEEE Solid-State Circuits Council.
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189
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10. 
Cover image for Telecommunications system reliability engineering, theory, and practice
Telecommunications system reliability engineering, theory, and practice
Author 
Ayers, Mark L.
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6331044
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11. 
Cover image for Reliability wearout mechanisms in advanced CMOS technologies
Reliability wearout mechanisms in advanced CMOS technologies
Author 
Strong, Alvin Wayne, 1946-
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029
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12. 
Cover image for Rules of thumb for maintenance and reliability engineers
Rules of thumb for maintenance and reliability engineers
Author 
Smith, Ricky. Mobley, R. Keith, 1943-
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ScienceDirect http://www.sciencedirect.com/science/book/9780750678629
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