Limit Search Results
Author
Language
Publication Date
-
Subject
Material Type
Shelf Location
Library
Switch to list view
Switch to thumbnail view
Select an Action
14 Results Found Subscribe to search results
000000000000DEFAULT
Print
1. 
Cover image for Confocal Raman Microscopy
Confocal Raman Microscopy
Author 
Dieing, Thomas. editor. Hollricher, Olaf. editor. Toporski, Jan. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-12522-5
Format: 
Availability 
Online Library~1
Available:
Copies:
2. 
Cover image for Acoustic Scanning Probe Microscopy
Acoustic Scanning Probe Microscopy
Author 
Marinello, Francesco. editor. Passeri, Daniele. editor. Savio, Enrico. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333153.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-27494-7
Format: 
Availability 
Online Library~1
Available:
Copies:
3. 
Cover image for Noncontact Atomic Force Microscopy Volume 2
Noncontact Atomic Force Microscopy Volume 2
Author 
Morita, Seizo. editor. Giessibl, Franz J. editor. Wiesendanger, Roland. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-01495-6
Format: 
Availability 
Online Library~1
Available:
Copies:
4. 
Cover image for New Horizons of Applied Scanning Electron Microscopy
New Horizons of Applied Scanning Electron Microscopy
Author 
Shimizu, Kenichi. author. Mitani, Tomoaki. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-03160-1
Format: 
Availability 
Online Library~1
Available:
Copies:
5. 
Cover image for Scanning Probe Microscopy in Nanoscience and Nanotechnology
Scanning Probe Microscopy in Nanoscience and Nanotechnology
Author 
Bhushan, Bharat. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-03535-7
Format: 
Availability 
Online Library~1
Available:
Copies:
6. 
Cover image for Scanning Probe Microscopy in Nanoscience and Nanotechnology 3
Scanning Probe Microscopy in Nanoscience and Nanotechnology 3
Author 
Bhushan, Bharat. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333137.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-25414-7
Format: 
Availability 
Online Library~1
Available:
Copies:
7. 
Cover image for Kelvin Probe Force Microscopy Measuring and Compensating Electrostatic Forces
Kelvin Probe Force Microscopy Measuring and Compensating Electrostatic Forces
Author 
Sadewasser, Sascha. editor. Glatzel, Thilo. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-22566-6
Format: 
Availability 
Online Library~1
Available:
Copies:
8. 
Cover image for Atomic Force Microscopy Based Nanorobotics Modelling, Simulation, Setup Building and Experiments
Atomic Force Microscopy Based Nanorobotics Modelling, Simulation, Setup Building and Experiments
Author 
Xie, Hui. author. Onal, Cagdas. author. Régnier, Stéphane. author. Sitti, Metin. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-20329-9
Format: 
Availability 
Online Library~1
Available:
Copies:
9. 
Cover image for Scanning Probe Microscopy in Nanoscience and Nanotechnology 2
Scanning Probe Microscopy in Nanoscience and Nanotechnology 2
Author 
Bhushan, Bharat. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-10497-8
Format: 
Availability 
Online Library~1
Available:
Copies:
10. 
Cover image for Nanomaterials Imaging Techniques, Surface Studies, and Applications Selected Proceedings of the FP7 International Summer School Nanotechnology: From Fundamental Research to Innovations, August 26-September 2, 2012, Bukovel, Ukraine
Nanomaterials Imaging Techniques, Surface Studies, and Applications Selected Proceedings of the FP7 International Summer School Nanotechnology: From Fundamental Research to Innovations, August 26-September 2, 2012, Bukovel, Ukraine
Author 
Fesenko, Olena. editor. Yatsenko, Leonid. editor. Brodin, Mikhaylo. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(332321.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-7675-7
Format: 
Availability 
Online Library~1
Available:
Copies:
11. 
Cover image for Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance
Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance
Author 
van Schooten, Kipp. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(332776.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-319-00590-4
Format: 
Availability 
Online Library~1
Available:
Copies:
12. 
Cover image for Encyclopedia of Biophysics
Encyclopedia of Biophysics
Author 
Roberts, Gordon C. K. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333072.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-16712-6
Format: 
Availability 
Online Library~1
Available:
Copies: