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1. 
Cover image for Particle Size Measurements Fundamentals, Practice, Quality
Particle Size Measurements Fundamentals, Practice, Quality
Author 
Merkus, Henk G. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-9016-5
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2. 
Cover image for Microscopy of Semiconducting Materials 2007
Microscopy of Semiconducting Materials 2007
Author 
Cullis, A. G. editor. Midgley, P. A. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-8615-1
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3. 
Cover image for Structural Synthesis in Precision Elasticity
Structural Synthesis in Precision Elasticity
Author 
Tseytlin, Yakov M. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b105079
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Online Library~1
Available:
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