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1. 
Cover image for Differentiated Layout Styles for MOSFETs Electrical Behavior in Harsh Environments
Differentiated Layout Styles for MOSFETs Electrical Behavior in Harsh Environments
Author 
Gimenez, Salvador Pinillos. author. Galembeck, Egon Henrique Salerno. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-29086-2
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2. 
Cover image for Silicon Semiconductor Technology Processing and Integration of Microelectronic Devices
Silicon Semiconductor Technology Processing and Integration of Microelectronic Devices
Author 
Hilleringmann, Ulrich. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-658-41041-4
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3. 
Cover image for Physics of Semiconductor Devices
Physics of Semiconductor Devices
Author 
Rudan, Massimo. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-1-4939-1151-6
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4. 
Cover image for CMOS Test and Evaluation A Physical Perspective
CMOS Test and Evaluation A Physical Perspective
Author 
Bhushan, Manjul. author. Ketchen, Mark B. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-1-4939-1349-7
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5. 
Cover image for Dry Etching Technology for Semiconductors
Dry Etching Technology for Semiconductors
Author 
Nojiri, Kazuo. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-10295-5
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6. 
Cover image for Functional Nanomaterials and Devices for Electronics, Sensors and Energy Harvesting
Functional Nanomaterials and Devices for Electronics, Sensors and Energy Harvesting
Author 
Nazarov, Alexei. editor. Balestra, Francis. editor. Kilchytska, Valeriya. editor. Flandre, Denis. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-08804-4
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