Testing static random access memories : Defects, fault models, and test patterns

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Title:

Author:

Hamdioui, Said.

ISBN:

9781402077524

Publication Information:

Boston : Kluwer Academic, 2004.

Physical Description:

xx, 221 s.

Series:

Frontiers in electronic testing

Subject Term:

Holds:
Copies:

Library	Material Type	Item Barcode	Shelf Number	Status	Item Holds
Searching... Beytepe Library	Book	7.2/19/3834	TK7895.M4 H34 2004	Searching... Unknown	Searching... Unavailable