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1. 
Cover image for Contamination and ESD control in high technology manufacturing
Contamination and ESD control in high technology manufacturing
Author 
Welker, R. W. Nagarajan, R. (Ramamurthy) Newberg, Carl E. John Wiley & Sons.
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ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201423
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2. 
Cover image for ESD circuits and devices
ESD circuits and devices
Author 
Voldman, Steven H. John Wiley & Sons.
Preferred Shelf Number 
ONLINE
Electronic Access 
Click for information
John Wiley http://dx.doi.org/10.1002/0470033479
http://www3.interscience.wiley.com/cgi-bin/bookhome/112572259
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3. 
Cover image for Electronic materials science
Electronic materials science
Author 
Irene, Eugene A. John Wiley & Sons.
Preferred Shelf Number 
ONLINE
Electronic Access 
Contributor biographical information http://catdir.loc.gov/catdir/enhancements/fy0616/2004016686-b.html
John Wiley http://dx.doi.org/10.1002/0471711640
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