Cover image for Combinatorial Algorithms 25th International Workshop, IWOCA 2014, Duluth, MN, USA, October 15-17, 2014, Revised Selected Papers
Title:
Combinatorial Algorithms 25th International Workshop, IWOCA 2014, Duluth, MN, USA, October 15-17, 2014, Revised Selected Papers
Author:
Jan, Kratochvíl. editor.
ISBN:
9783319193151
Edition:
1st ed. 2015.
Physical Description:
XIII, 377 p. 70 illus. online resource.
Series:
Theoretical Computer Science and General Issues, 8986
Contents:
On the Complexity of Various Parameterizations of Common Induced Subgraph Isomorphism -- Approximation and Hardness Results for the Maximum Edges in Transitive Closure Problem -- Quantifying Privacy: A Novel Entropy-Based Measure of Disclosure Risk -- On the Galois Lattice of Bipartite Distance Hereditary Graphs -- Fast Simple Computations Using Prefix Tables under Hamming and Edit Distance -- Border Correlations, Lattices and the Subgraph Component Polynomial -- Computing Minimum Length Representations of Sets of Words of Uniform Length -- Computing Primitively-Rooted Squares and Runs in Partial Words -- 3-coloring triangle-free planar graphs with a precolored 9-cycle -- Computing Heat Kernel Pagerank and a Local Clustering Algorithm -- Solving Matching Problems Efficiently in Bipartite Graphs -- A 3-Approximation Algorithm for Guarding Orthogonal Art Galleries with Sliding Cameras -- On decomposing the complete graph into the union of two disjoint cycles -- Reconfiguration of Vertex Covers in a Graph -- Space Efficient Data Structures for Nearest Larger Neighbor Playing several variants of Mastermind with constant-size memory is not harder than with unbounded memory -- On Maximum Common Subgraph Problems in Series-Parallel Graphs -- Profile-based optimal matchings in the Student/Project Allocation Problem -- The Min-Max Edge q-Coloring Problem -- Speeding up Graph Algorithms via Switching Classes -- Metric Dimension for Amalgamations of Graphs -- Deterministic Algorithms for the Independent Feedback Vertex Set Problem -- Lossless seeds for searching short patterns with high error rates.
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