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1. 
Cover image for Metrology
Metrology
Author 
Gao, Wei. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-10-4938-5
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2. 
Cover image for Mass Metrology
Mass Metrology
Author 
Gupta, S. V. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-23412-5
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3. 
Cover image for Information Modeling for Interoperable Dimensional Metrology
Information Modeling for Interoperable Dimensional Metrology
Author 
Zhao, Yaoyao (Fiona). author. Brown, Robert. author. Kramer, Thomas R. author. Xu, Xun. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4471-2167-1
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4. 
Cover image for Springer Handbook of Metrology and Testing
Springer Handbook of Metrology and Testing
Author 
Czichos, Horst. editor. Saito, Tetsuya. editor. Smith, Leslie. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-16641-9
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5. 
Cover image for Computational Surface and Roundness Metrology
Computational Surface and Roundness Metrology
Author 
Muralikrishnan, Bala. author. Raja, Jay. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-84800-297-5
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6. 
Cover image for Metrology for Fire Experiments in Outdoor Conditions
Metrology for Fire Experiments in Outdoor Conditions
Author 
Silvani, Xavier. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(332373.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-7962-8
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7. 
Cover image for Graphene Nanoelectronics Metrology, Synthesis, Properties and Applications
Graphene Nanoelectronics Metrology, Synthesis, Properties and Applications
Author 
Raza, Hassan. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-22984-8
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8. 
Cover image for Distributed Large-Scale Dimensional Metrology New Insights
Distributed Large-Scale Dimensional Metrology New Insights
Author 
Franceschini, Fiorenzo. author. Galetto, Maurizio. author. Maisano, Domenico. author. Mastrogiacomo, Luca. author. Pralio, Barbara. author.
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-85729-543-9
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9. 
Cover image for Advances in Manufacturing II Volume 5 - Metrology and Measurement Systems
Advances in Manufacturing II Volume 5 - Metrology and Measurement Systems
Author 
Diering, Magdalena. editor. Wieczorowski, Michał. editor. Brown, Christopher A. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-030-18682-1
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10. 
Cover image for Fringe 2013 7th International Workshop on Advanced Optical Imaging and Metrology
Fringe 2013 7th International Workshop on Advanced Optical Imaging and Metrology
Author 
Osten, Wolfgang. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-642-36359-7
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11. 
Cover image for Optical Measurements, Modeling, and Metrology, Volume 5 Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics
Optical Measurements, Modeling, and Metrology, Volume 5 Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics
Author 
Proulx, Tom. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-0228-2
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12. 
Cover image for The Physics of Metrology All about Instruments: From Trundle Wheels to Atomic Clocks
The Physics of Metrology All about Instruments: From Trundle Wheels to Atomic Clocks
Author 
Hebra, Alexius J. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-211-78381-8
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13. 
Cover image for Fringe 2009 6th International Workshop on Advanced Optical Metrology
Fringe 2009 6th International Workshop on Advanced Optical Metrology
Author 
Osten, Wolfgang. editor. Kujawinska, Malgorzata. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-03051-2
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14. 
Cover image for Data Modeling for Metrology and Testing in Measurement Science
Data Modeling for Metrology and Testing in Measurement Science
Author 
Pavese, Franco. editor. Forbes, Alistair B. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-8176-4804-6
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15. 
Cover image for Quality Assurance for Chemistry and Environmental Science Metrology from pH Measurement to Nuclear Waste Disposal
Quality Assurance for Chemistry and Environmental Science Metrology from pH Measurement to Nuclear Waste Disposal
Author 
Meinrath, G. author. Schneider, Petra. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-71273-2
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16. 
Cover image for Clinical and Laboratory Medicine Textbook
Clinical and Laboratory Medicine Textbook
Author 
Ciaccio, Marcello. editor. SpringerLink (Online service)
Preferred Shelf Number 
XX(522249.1)
Electronic Access 
https://doi.org/10.1007/978-3-031-24958-7
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17. 
Cover image for Integrated Imaging and Vision Techniques for Industrial Inspection Advances and Applications
Integrated Imaging and Vision Techniques for Industrial Inspection Advances and Applications
Author 
Liu, Zheng. editor. Ukida, Hiroyuki. editor. Ramuhalli, Pradeep. editor. Niel, Kurt. editor. SpringerLink (Online service)
Preferred Shelf Number 
XX(518392.1)
Electronic Access 
https://doi.org/10.1007/978-1-4471-6741-9
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18. 
Cover image for Pattern Recognition and Machine Intelligence 6th International Conference, PReMI 2015, Warsaw, Poland, June 30 - July 3, 2015, Proceedings
Pattern Recognition and Machine Intelligence 6th International Conference, PReMI 2015, Warsaw, Poland, June 30 - July 3, 2015, Proceedings
Author 
Kryszkiewicz, Marzena. editor. Bandyopadhyay, Sanghamitra. editor. Rybinski, Henryk. editor. Pal, Sankar K. editor. SpringerLink (Online service)
Preferred Shelf Number 
XX(519185.1)
Electronic Access 
https://doi.org/10.1007/978-3-319-19941-2
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19. 
Cover image for Pattern Recognition and Image Analysis 7th Iberian Conference, IbPRIA 2015, Santiago de Compostela, Spain, June 17-19, 2015, Proceedings
Pattern Recognition and Image Analysis 7th Iberian Conference, IbPRIA 2015, Santiago de Compostela, Spain, June 17-19, 2015, Proceedings
Author 
Paredes, Roberto. editor. Cardoso, Jaime S. editor. Pardo, Xosé M. editor. SpringerLink (Online service)
Preferred Shelf Number 
XX(519035.1)
Electronic Access 
https://doi.org/10.1007/978-3-319-19390-8
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