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1. 
Cover image for ESD failure mechanisms and models
ESD failure mechanisms and models
Author 
Voldman, Steven H. Wiley InterScience (Online service)
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John Wiley http://dx.doi.org/10.1002/9780470747254
http://site.ebrary.com/lib/alltitles/Doc?id=10317806
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2. 
Cover image for Electrical characterization of organic electronic materials and devices
Electrical characterization of organic electronic materials and devices
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Stallinga, Peter, 1966- Wiley InterScience (Online service)
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John Wiley http://dx.doi.org/10.1002/9780470750162
http://site.ebrary.com/lib/alltitles/Doc?id=10342813
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3. 
Cover image for Processing of nanoparticle structures and composites a collection of papers presented at the 2008 Materials Science and Technology Conference (MS & T08) October 5-9, 2008, Pittsburgh, Pennsylvania
Processing of nanoparticle structures and composites a collection of papers presented at the 2008 Materials Science and Technology Conference (MS & T08) October 5-9, 2008, Pittsburgh, Pennsylvania
Author 
Materials Science & Technology Conference (2008 : Pittsburgh, Pa.) Hinklin, Tom. Lu, Kathy. Wiley InterScience (Online service)
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John Wiley http://dx.doi.org/10.1002/9780470551523
http://site.ebrary.com/lib/alltitles/Doc?id=10341612
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4. 
Cover image for Organic electronics structural and electronic properties of OFETs
Organic electronics structural and electronic properties of OFETs
Author 
Wöll, Christof. Wiley InterScience (Online service)
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Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=482374
John Wiley http://dx.doi.org/10.1002/9783527627387
http://www3.interscience.wiley.com/cgi-bin/bookhome/122498289
http://site.ebrary.com/lib/alltitles/Doc?id=10313609
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