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Cover image for Defect control in semiconductors proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989. Vol. 2
Defect control in semiconductors proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989. Vol. 2
Author 
International Conference on the Science and Technology of Defect Control in Semiconductors (1989 : Yokohama-shi, Japan) Sumino, K. (Kōji), 1931-
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ScienceDirect http://www.sciencedirect.com/science/book/9780444884299
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2. 
Cover image for Practical switching power supply design
Practical switching power supply design
Author 
Brown, Marty, 1951- Elsevier Science Publishers.
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ScienceDirect http://www.sciencedirect.com/science/book/9780121370305
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