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1. 
Cover image for Nanotechnology and nanoelectronics : materials, devices, measurement techniques
Nanotechnology and nanoelectronics : materials, devices, measurement techniques
Author 
Fahrner, W. R. (Wolfgang R.), ed.
Preferred Shelf Number 
T174.7 N3732 2005
Format: 
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Beytepe Library~2
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2. 
Cover image for Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale
Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale
Author 
Kalinin, Sergei. Gruverman, Alexei.
Preferred Shelf Number 
QH212. S33 2007 V.2
Format: 
Availability 
Beytepe Library~2
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