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Cover image for Defect control in semiconductors proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989. Vol. 2
Defect control in semiconductors proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989. Vol. 2
Author 
International Conference on the Science and Technology of Defect Control in Semiconductors (1989 : Yokohama-shi, Japan) Sumino, K. (Kōji), 1931-
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780444884299
Format: 
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Online Library~1
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2. 
Cover image for The physics and chemistry of carbides, nitrides, and borides
The physics and chemistry of carbides, nitrides, and borides
Author 
Freer, R., ed.
Preferred Shelf Number 
TA 418.26 N38 1989
Format: 
Availability 
Beytepe Library~1
Available:
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